Real-time monitoring of the semiconductor wirebond interconnection process for production yield and quality improvement

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings of the International Conference on Industrial Engineering and Operations Management
PublisherIEOM Society
Pages678-686
Number of pages9
EditionMarch
ISBN (Print)9781532359491, 9781532359514, 9781532359521
StatePublished - 2020
Event10th Annual International IEOM Conference, IEOM 2020 - Dubai, United Arab Emirates
Duration: Mar 10 2020Mar 12 2020

Publication series

NameProceedings of the International Conference on Industrial Engineering and Operations Management
NumberMarch
Volume0
ISSN (Electronic)2169-8767

Conference

Conference10th Annual International IEOM Conference, IEOM 2020
Country/TerritoryUnited Arab Emirates
CityDubai
Period3/10/203/12/20

ASJC Scopus Subject Areas

  • Strategy and Management
  • Management Science and Operations Research
  • Control and Systems Engineering
  • Industrial and Manufacturing Engineering

Keywords

  • Device under test
  • Production yield
  • Quality improvement
  • Wirebond

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