Isolating Defects in Light Beam Induced Current Maps of Solar Cells

Genevieve C. Ngo; Erees Queen B. Macabebe

doi:10.1109/TENCON.2018.8650105

Isolating Defects in Light Beam Induced Current Maps of Solar Cells

Genevieve C. Ngo, Erees Queen B. Macabebe

Department of Electronics, Computer, and Communications Engineering

Ateneo de Manila University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1479-1483
Number of pages	5
ISBN (Electronic)	9781538654576
DOIs	https://doi.org/10.1109/TENCON.2018.8650105
State	Published - Jul 2 2018
Event	2018 IEEE Region 10 Conference, TENCON 2018 - Jeju, Korea, Republic of Duration: Oct 28 2018 → Oct 31 2018

Publication series

Name	IEEE Region 10 Annual International Conference, Proceedings/TENCON
Volume	2018-October
ISSN (Print)	2159-3442
ISSN (Electronic)	2159-3450

Conference

Conference	2018 IEEE Region 10 Conference, TENCON 2018
Country/Territory	Korea, Republic of
City	Jeju
Period	10/28/18 → 10/31/18

ASJC Scopus Subject Areas

Computer Science Applications
Electrical and Electronic Engineering

Keywords

Image Inpainting
Image Processing
Image Segmentation
LBIC Mapping

Access to Document

10.1109/TENCON.2018.8650105

Cite this

Ngo, G. C., & Macabebe, E. Q. B. (2018). Isolating Defects in Light Beam Induced Current Maps of Solar Cells. In Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference (pp. 1479-1483). Article 8650105 (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 2018-October). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/TENCON.2018.8650105

Isolating Defects in Light Beam Induced Current Maps of Solar Cells. / Ngo, Genevieve C.; Macabebe, Erees Queen B.
Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference. Institute of Electrical and Electronics Engineers Inc., 2018. p. 1479-1483 8650105 (IEEE Region 10 Annual International Conference, Proceedings/TENCON; Vol. 2018-October).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ngo, GC & Macabebe, EQB 2018, Isolating Defects in Light Beam Induced Current Maps of Solar Cells. in Proceedings of TENCON 2018 - 2018 IEEE Region 10 Conference., 8650105, IEEE Region 10 Annual International Conference, Proceedings/TENCON, vol. 2018-October, Institute of Electrical and Electronics Engineers Inc., pp. 1479-1483, 2018 IEEE Region 10 Conference, TENCON 2018, Jeju, Korea, Republic of, 10/28/18. https://doi.org/10.1109/TENCON.2018.8650105

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title = "Isolating Defects in Light Beam Induced Current Maps of Solar Cells",

keywords = "Image Inpainting, Image Processing, Image Segmentation, LBIC Mapping",

author = "Ngo, {Genevieve C.} and Macabebe, {Erees Queen B.}",

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Isolating Defects in Light Beam Induced Current Maps of Solar Cells

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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