@article{fc1aa5ebdda1486cb299555fb4b68f26,
title = "Interface Test Adapter (ITA) Design for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Cycle Time",
keywords = "automatic test equipment, electrostatic discharge, failure analysis, integrated circuit reliability, integrated circuit testing, microcontrollers, semiconductor diodes, surge protection, transients",
author = "Francis Malabanan and Abu, \{Patricia Angela R\} and Carlos Oppus and Reyes, \{Rosula SJ\}",
note = "F. Malabanan, P. A. Abu, C. Oppus and R. Reyes, {"}Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time,{"} 2019 IEEE Eurasia Conference on IOT, Communication and Engineering (ECICE), Yunlin, Taiwan, 2019, pp. 390-393, doi: 10.1109/ECICE47484.2019.8942726.",
year = "2019",
month = dec,
day = "1",
language = "American English",
journal = "Electronics, Computer, and Communications Engineering Faculty Publications",
}