Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

Francis Malabanan; Patricia Angela Abu; Carlos Oppus; Rosula Reyes

doi:10.1109/ECICE47484.2019.8942726

Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

Francis Malabanan, Patricia Angela Abu, Carlos Oppus, Rosula Reyes

Ateneo de Manila University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019
Editors	Teen-Hang Meen
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	390-393
Number of pages	4
ISBN (Electronic)	9781728125015
DOIs	https://doi.org/10.1109/ECICE47484.2019.8942726
State	Published - Oct 2019
Event	2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019 - Yunlin, Taiwan, Province of China Duration: Oct 3 2019 → Oct 6 2019

Publication series

Name	2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019

Conference

Conference	2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019
Country/Territory	Taiwan, Province of China
City	Yunlin
Period	10/3/19 → 10/6/19

ASJC Scopus Subject Areas

Artificial Intelligence
Computer Science Applications
Information Systems and Management
Energy Engineering and Power Technology
Safety, Risk, Reliability and Quality
Renewable Energy, Sustainability and the Environment
Computer Networks and Communications

Keywords

cycle time
interface test adapter (ITA)
transient voltage suppressor (TVS) diode

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

Access to Document

10.1109/ECICE47484.2019.8942726

Cite this

Malabanan, F., Abu, P. A., Oppus, C., & Reyes, R. (2019). Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time. In T.-H. Meen (Ed.), 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019 (pp. 390-393). Article 8942726 (2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ECICE47484.2019.8942726

Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time. / Malabanan, Francis; Abu, Patricia Angela ; Oppus, Carlos et al.
2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019. ed. / Teen-Hang Meen. Institute of Electrical and Electronics Engineers Inc., 2019. p. 390-393 8942726 (2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Malabanan, F, Abu, PA , Oppus, C & Reyes, R 2019, Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time. in T-H Meen (ed.), 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019., 8942726, 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019, Institute of Electrical and Electronics Engineers Inc., pp. 390-393, 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019, Yunlin, Taiwan, Province of China, 10/3/19. https://doi.org/10.1109/ECICE47484.2019.8942726

Malabanan F, Abu PA , Oppus C , Reyes R. Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time. In Meen TH, editor, 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019. Institute of Electrical and Electronics Engineers Inc. 2019. p. 390-393. 8942726. (2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019). doi: 10.1109/ECICE47484.2019.8942726

Malabanan, Francis ; Abu, Patricia Angela ; Oppus, Carlos et al. / Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time. 2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019. editor / Teen-Hang Meen. Institute of Electrical and Electronics Engineers Inc., 2019. pp. 390-393 (2019 IEEE Eurasia Conference on IOT, Communication and Engineering, ECICE 2019).

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author = "Francis Malabanan and Abu, {Patricia Angela} and Carlos Oppus and Rosula Reyes",

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Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

UN SDGs

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