TY - GEN
T1 - Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time
AU - Malabanan, Francis
AU - Abu, Patricia Angela
AU - Oppus, Carlos
AU - Reyes, Rosula
N1 - Publisher Copyright:
© 2022 IEEE.
PY - 2022
Y1 - 2022
KW - cycle time
KW - interface test adapter (ITA)
KW - transient voltage suppressor (TVS) diode
KW - unit per hour
UR - http://www.scopus.com/inward/record.url?scp=85127573791&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85127573791&partnerID=8YFLogxK
U2 - 10.1109/ICARA55094.2022.9738563
DO - 10.1109/ICARA55094.2022.9738563
M3 - Conference contribution
AN - SCOPUS:85127573791
T3 - 2022 8th International Conference on Automation, Robotics and Applications, ICARA 2022
SP - 176
EP - 180
BT - 2022 8th International Conference on Automation, Robotics and Applications, ICARA 2022
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 8th International Conference on Automation, Robotics and Applications, ICARA 2022
Y2 - 18 February 2022 through 20 February 2022
ER -