Design of an Interface Test Adapter for Sequential Testing of Transient Voltage Suppressor Diodes to Reduce Test Cycle Time

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publication2022 8th International Conference on Automation, Robotics and Applications, ICARA 2022
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages176-180
Number of pages5
ISBN (Electronic)9781665483834
DOIs
StatePublished - 2022
Event8th International Conference on Automation, Robotics and Applications, ICARA 2022 - Virtual, Online, Czech Republic
Duration: Feb 18 2022Feb 20 2022

Publication series

Name2022 8th International Conference on Automation, Robotics and Applications, ICARA 2022

Conference

Conference8th International Conference on Automation, Robotics and Applications, ICARA 2022
Country/TerritoryCzech Republic
CityVirtual, Online
Period2/18/222/20/22

ASJC Scopus Subject Areas

  • Artificial Intelligence
  • Computer Science Applications
  • Electrical and Electronic Engineering
  • Mechanical Engineering
  • Control and Optimization

Keywords

  • cycle time
  • interface test adapter (ITA)
  • transient voltage suppressor (TVS) diode
  • unit per hour

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